FISCHERSCOPE X-Ray XUV® 773
The XUV 773 is designed for thin layer measurement and analysis in general. Therefore it is dedicated for research, quality control and optimization of production processes. Typical applications are:
Thin coatings like CIGS, CIS, CdTe
Coatings and analysis in electronic and semiconductor industries
Gold, jewelry and gem stone analysis, without alteration of the sample
Analysis of traces, RoHS, WEEE
Thin coatings like CIGS, CIS, CdTe
Coatings and analysis in electronic and semiconductor industries
Gold, jewelry and gem stone analysis, without alteration of the sample
Analysis of traces, RoHS, WEEE
FISCHERSCOPE X-RAY 5000
The FISCHERSCOPE X-RAY 5000 instruments are innovative energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line applications in industrial production sites. They fulfill DIN ISO 3497 and ASTM B 568.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The FISCHERSCOPE X-RAY 5000 measures and analyzes layers and layer systems
- in the photo voltaic industry, i.e. CIGS, CIS, CdTe
- foils and belts
- alloys and coatings
- under ambient temperature or on very hot surfaces (up to 500°C / 932 F)
- in continuous operation and under industrial conditions
The FISCHERSCOPE X-RAY 5000 measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The FISCHERSCOPE X-RAY 5000 measures and analyzes layers and layer systems
- in the photo voltaic industry, i.e. CIGS, CIS, CdTe
- foils and belts
- alloys and coatings
- under ambient temperature or on very hot surfaces (up to 500°C / 932 F)
- in continuous operation and under industrial conditions
The FISCHERSCOPE X-RAY 5000 measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.
FISCHERSCOPE X-RAY XDAL
Description:
The XDAL instruments with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentrations and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
Typical areas of application are:
Analysis of very thin coatings, e.g. gold and palladium coatings of = 0.1 µm
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g. in quality control
Determination of the lead content in solder
The XDAL instruments with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentrations and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
Typical areas of application are:
Analysis of very thin coatings, e.g. gold and palladium coatings of = 0.1 µm
Measurement of functional coatings in the electronics and semiconductor industries
Determination of complex multi-coating systems
Automated measurements, e.g. in quality control
Determination of the lead content in solder
FISCHERSCOPE X-RAY XDL
Description:
The FISCHERSCOPE X-RAY XDL instruments are universally applicable energy dispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL-B model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and pc-boards as well as for the solution analysis.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDL x-ray spectrometers have an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort. The instruments of the XDL® series are especially well suited for measurements in quality assurance, reception inspection and production monitoring.
Typical areas of application are:
Measurement of electro-plated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on pc-boards
Solution analysis in the electroplating
The FISCHERSCOPE X-RAY XDL instruments are universally applicable energy dispersive x-ray spectrometers. They represent the next step in the development of the proven FISCHERSCOPE X-RAY XDL-B model series. Like their predecessors, they are particularly well suited for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and pc-boards as well as for the solution analysis.
A high count rate is achieved by using a proportional counter tube, which allows for precise measurements. Using the Fischer fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in the range from chlorine (17) to uranium (92) simultaneously.
The XDL x-ray spectrometers have an excellent long-term stability, which among other things is reflected in a significantly reduced calibration effort. The instruments of the XDL® series are especially well suited for measurements in quality assurance, reception inspection and production monitoring.
Typical areas of application are:
Measurement of electro-plated mass-produced parts
Inspection of thin coatings, e.g., decorative chromium-plating
Analysis of functional coatings in the electronics and semiconductor industries
Automated measurements, e.g., on pc-boards
Solution analysis in the electroplating